The use of electronic speckle pattern interferometry (ESPI) now enables the advantages of whole-field component analysis to be applied in real time to inspect equipment in workshop facilities. An attempt is made to identify some recent developments which now yield high-quality quantifiable results to the engineering community. The results given concentrate on applications concerning both the component response and the system response. ESPI combines the benefits of holographic optical data with the ability to undertake digital image processing.

Author: Tyrer, John R.
Affiliation: Department of Mechanical Engineering, Loughborough University of Technology, Loughborough, UK
JAES Volume 36 Issue 5 pp. 342-349; May 1988
Publication Date: May 1, 1988 Import into BibTeX
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=5150

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