A method of measuring surface impedance in-situ is presented. A source is set close to the surface of the material, in order to minimize the finite dimension effect of the sample, and the effect of the reflections on the walls and the ceiling of the room. The pressure above the material is measured simultaneously with two microphones, and measurement is compared a model of Hayek.

Authors: Allard, Jean-F.; Champoux, Yvan
Affiliation: University of Maine, Le Mans, France
AES Convention: 86 (March 1989) Paper Number: 2786
Publication Date: March 1, 1989 Import into BibTeX
Subject: Measurement & Instrumentation
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=5908

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