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Microprocessor based analog/digital systems present a unique set of problems during design and test. Relating symptoms in both the analog and digital domain to their hardware or software sources often becomes a challenge. Using a modular logic analysis system, cross domain analysis correlates symptoms with their sources by displaying state, timing, and analog data simultaneously with a common trigger point. This paper demonstrates cross domain analysis through explanation and example.
Author (s): Bowker, Robert E.;
Affiliation:
Hewlett-Packard, Colorado Springs, CO
(See document for exact affiliation information.)
AES Convention: 91
Paper Number:3144
Publication Date:
1991-10-06
Session subject:
Digital Technology
DOI:
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Bowker, Robert E.; 1991; Using Cross-Domain Analysis in the Design and Test of Analog-Digital Systems [PDF]; Hewlett-Packard, Colorado Springs, CO; Paper 3144; Available from: https://aes.org/publications/elibrary-page/?id=5572
Bowker, Robert E.; Using Cross-Domain Analysis in the Design and Test of Analog-Digital Systems [PDF]; Hewlett-Packard, Colorado Springs, CO; Paper 3144; 1991 Available: https://aes.org/publications/elibrary-page/?id=5572
@inproceedings{Bowker1991using,
title={{Using Cross-Domain Analysis in the Design and Test of Analog-Digital Systems}},
author={Bowker, Robert E.},
year={1991},
month={oct},
booktitle={Journal of the Audio Engineering Society},
publisher={Paper 3144; AES Convention 91; October 1991},
number={3144},
organization={AES},
}
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