AES E-Library

AES E-Library

Using Cross-Domain Analysis in the Design and Test of Analog-Digital Systems

Document Thumbnail

Microprocessor based analog/digital systems present a unique set of problems during design and test. Relating symptoms in both the analog and digital domain to their hardware or software sources often becomes a challenge. Using a modular logic analysis system, cross domain analysis correlates symptoms with their sources by displaying state, timing, and analog data simultaneously with a common trigger point. This paper demonstrates cross domain analysis through explanation and example.

Author:
Affiliation:
AES Convention: Paper Number:
Publication Date:
Subject:
Permalink: http://www.aes.org/e-lib/browse.cfm?elib=5572

Click to purchase paper as a non-member or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member and would like to subscribe to the E-Library then Join the AES!

This paper costs $33 for non-members and is free for AES members and E-Library subscribers.

Learn more about the AES E-Library

E-Library Location:

Start a discussion about this paper!


AES - Audio Engineering Society