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Using Cross-Domain Analysis in the Design and Test of Analog-Digital Systems

Microprocessor based analog/digital systems present a unique set of problems during design and test. Relating symptoms in both the analog and digital domain to their hardware or software sources often becomes a challenge. Using a modular logic analysis system, cross domain analysis correlates symptoms with their sources by displaying state, timing, and analog data simultaneously with a common trigger point. This paper demonstrates cross domain analysis through explanation and example.

Author: Bowker, Robert E.
Affiliation: Hewlett-Packard, Colorado Springs, CO
AES Convention:91 (October 1991) Paper Number:3144 Import into BibTeX
Subject:Digital Technology

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