The use of electronic speckle pattern interferometry (ESPI) now enables the advantages of whole-field component analysis to be applied in real time to inspect equipment in workshop facilities. An attempt is made to identify some recent developments which now yield high-quality quantifiable results to the engineering community. The results given concentrate on applications concerning both the component response and the system response. ESPI combines the benefits of holographic optical data with the ability to undertake digital image processing.
Click to purchase paper as a non-member or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member and would like to subscribe to the E-Library then Join the AES!
This paper costs $33 for non-members and is free for AES members and E-Library subscribers.