A perceptually-driven distortion metric for headphones is proposed that is based on a critical-band spectral comparison of the distortion and noise to an appropriate masked threshold, when the headphone is excited by a sine wave signal. Additionally, new headphone-based masking curves for 20, 50, 100, 200, 315, 400, and 500 Hz sine waves are derived by subjective tests using bands of narrow-band noise being masked by a sine wave signal. The ratios of measured distortion and noise levels in critical bands over the appropriate masking curve values are compared, with the critical bands starting at the second harmonic. Once this is done the audibility of all these contributions are combined into a single audibility value. Extension to loudspeaker measurements is briefly discussed.
本文提出了一种关于感知方面的耳机失真度量参数，是基于当耳机被正弦波信号激励时，在临界带范围内，比较失真信号和噪声的频谱，从而得到合适的掩蔽阈值。此外，用于20,50,100,200,315,400和500Hz正弦波激励的新的耳机掩蔽曲线，采用窄带噪声作为目标信号，正弦波作为掩蔽信号，通过主观测试得到掩蔽曲线。从二次谐波开始的临界频带中，计算测量失真及噪声电平与相应掩蔽曲线的比率，并比较得出的比率。当这些测试一旦完成，所有这些对可听度做出贡献的值就会合并为一个可听度值。本文还简要的讨论了如何扩展到扬声器方面的测量。
https://www.aes.org/e-lib/browse.cfm?elib=19238
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