AES E-Library

FET Temperature Characteristics

Before designing to stabilize circuit drift due to changing temperatures it is helpful and sometimes necessary to understand and explain the physics of the observed drifts. In the case of the Junction Gate FET this enables minimizing of temperature effects using the characteristics of the device itself. It is the purpose of this paper to outline FET temperature characteristics.

 

Author (s):
Affiliation: (See document for exact affiliation information.)
AES Convention: Paper Number:
Publication Date:

DOI:


Click to purchase paper as a non-member or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member Join the AES. If you need to check your member status, login to the Member Portal.

Type:
16938
Choose your country of residence from this list: