During the loudspeaker manufacturing process, particles may become trapped inside the loudspeaker, resulting in a distinctive defect that is easily heard but difficult to measure. To give a clearer view of the problem, Time-Frequency maps are shown for some defective loudspeakers. Based on this analysis, a reliable testing procedure using a swept-sine stimulus, high-pass filter, and RMS-envelope analysis is presented. Further possible enhancements and applications of the method are listed.
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