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History and Development of the Lede Control Room Concept

There is a considerable amount of controversy and misconception surrounding this relatively new control room design concept. The authors propose to outlline the original test data, obtained via TDS, which provided the formulative basis of the concept, and the subsequent developments provided through the use of the Time-Energy-Frequency test system.

Authors: Davis, Chips; Meeks, Glenn E.
Affiliations: LEDE Designs, Las Vegas, NV ; E. A. Designs, Indianapolis, IN(See document for exact affiliation information.)
AES Convention:72 (October 1982) Paper Number:1954 Import into BibTeX

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