This paper reviews the treatment of non-linear distortion as a mathematical process, which can also be visualized graphically. It will also be shown that a spectrum analyzer (or wave analyzer) can be used to learn whether the order of a particular distortion frequency-component is caused by square-law or cubic distortion in the device. The concept of second and third-order intercept point will be reviewed. There will also be a discussion of high-frequency oscillation-produced low-frequency distortion, differential phase distortion, and quadrature distortion.

Author: Talbot, Daniel B.
Affiliation: Talbot Technology (T-TECH) Corp., Hudson, MA
AES Convention: 76 (October 1984) Paper Number: 2134
Publication Date: October 1, 1984 Import into BibTeX
Subject: Instrumentation and Measurement
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=11621

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