AES E-Library

A Review of Non-Linear Distortion Fundamentals

This paper reviews the treatment of non-linear distortion as a mathematical process, which can also be visualized graphically. It will also be shown that a spectrum analyzer (or wave analyzer) can be used to learn whether the order of a particular distortion frequency-component is caused by square-law or cubic distortion in the device. The concept of second and third-order intercept point will be reviewed. There will also be a discussion of high-frequency oscillation-produced low-frequency distortion, differential phase distortion, and quadrature distortion.

Author: Talbot, Daniel B.
Affiliation: Talbot Technology (T-TECH) Corp., Hudson, MA
AES Convention:76 (October 1984) Paper Number:2134 Import into BibTeX
Subject:Instrumentation and Measurement

Click to purchase paper or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member and would like to subscribe to the E-Library then Join the AES!

This paper costs $20 for non-members, $5 for AES members and is free for E-Library subscribers.

Learn more about the AES E-Library

E-Library Location: (CD aes10)   /pp8185/pp8410/2230.pdf

Start a discussion about this paper!