AES E-Library

Noise Shaping in Digital Test-Signal Generation

We extend an idea, proposed in an earlier paper, to use noise-shaping techniques in the generation of digital test signals. The previous paper proposed using noise shaping around an undithered quantizer to generate sinusoidal digital test signals with spectra having error nulls at the harmonics of the signal frequency, thus making digital distortion measurements of very great dynamic range possible. We extend this idea in a number of ways. We show: (a) that dither is necessary in order to suppress spurious artifacts caused by the nonlinearity of an undithered noise shaper, (b) that wider and deeper nulls at the harmonic frequencies can be achieved by using higher-order noise-shaper designs, (c) that IIR filter designs can moderate the increased noise power that accompanies an increased FIR filter order, and (d) some other novel uses of noise shaping in digital signal generation.

Authors: Semyonov, Edward V.; Lipshitz, Stanley P.; Vanderkooy, John
Affiliations: Audio Research Group, University of Waterloo, Waterloo, Ontario, Canada ; Department of Radio Electronics and Information Protection, Tomsk State University of Control Systems and Radioelectronics, Tomsk, Russia(See document for exact affiliation information.)
AES Convention:113 (October 2002) Paper Number:5664 Import into BibTeX
Subject:Signal Processing

Click to purchase paper or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member and would like to subscribe to the E-Library then Join the AES!

This paper costs $20 for non-members, $5 for AES members and is free for E-Library subscribers.

Learn more about the AES E-Library

E-Library Location: (CD aes19)   /pp2002/pp0210/000277.pdf

Start a discussion about this paper!