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Improved Low Frequency Microphone Testing

Testing of directional microphones under free-field conditions at low frequencies is problematic if an anechoic chamber is used beneath its cutoff frequency. In accordance to IEC 268-T4 guided waves in a correctly terminated duct can be used to produce a plane, travelling wave at low frequencies. An active absorber system is introduced which reduces the length of the tube and improves the reflection coefficient. First measurements in a test setup are presented.

Authors: Sander-Röttcher, Harald; Tams, Kersten
Affiliation: Sennheiser-electronic KG., Wedemark, Germany
AES Convention:92 (March 1992) Paper Number:3234 Import into BibTeX
Subject:Measurement, Technique, and Instrumentation

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E-Library Location: (CD aes12)   /pp9193/pp9203/3294.pdf

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