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Distortion Measurements by Multiple-Tone Method

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A new distortion measuring method will be presented which uses a test signal that consists of multiple tones. The frequencies of the tones are selected so that their derivations, such as harmonic and intermodulation products, do not coincide with each other or with the applied tones. Assuming that the measured distortion is caused by second and third-power nonlinearities of the device under test, this enables us to track down the source of the distortion in the system. The measurements and signal processing are carried out under the control of a computer. Some measurement results on distortion-simulating circuits and power amplifiers will be presented, and the validity of this method will be discussed.

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