The standard Thiel/Small analysis techniques have made possible an accurate method for modeling the low frequency characteristics of dynamic transducers. A new computer program has been developed based on a combined lumped/distributed system analysis which permits the quantization of various parasitic parameters (such as box leakage resistance) through an iteration technique. The approach taken and various results will be discussed.

Authors: Blind, Henry; Dorfstatter, Walter; Geddes, Earl
Affiliation: Ford Motor Company, Dearborn, MI
AES Convention: 78 (May 1985) Paper Number: 2234
Publication Date: May 1, 1985 Import into BibTeX
Subject: Reproduction
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=11521

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