Measurement of Sampling Jitter in Analog-to-Digital and Digital-to-Analog Converters Using Analytic Signals
A method of sampling jitter measurement based on time-domain analytic signals is proposed. Computer simulations and measurements were performed in order to compare the proposed method to the conventional method, in which jitter is evaluated based on amplitudes of sideband spectra for observed signals in the frequency-domain. The results show that the proposed method is effective in that this method: 1) provides good temporal resolution as a result of the direct derivation of jitter waveform, 2) achieves higher precision in measurement of jitter amplitude, and 3) can separate sidebands that originated in sampling jitter from sidebands caused by amplitude fluctuations, while observing the power spectra, because both amplitude fluctuation waveform and jitter waveform can be derived from analytic signals.
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