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Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer

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For the estimation and the simulation of linear and nonlinear distortions caused by thermally effected power-dependent internal feedback (TPF), the thermal impedance has to be measured. Conventional measurements refer to the time domain; they analyze the response to switched changes of power dissipation. This paper proposes measurements in the frequency domain with the advantage that an audio analyzer can be employed.

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Permalink: http://www.aes.org/e-lib/browse.cfm?elib=7798

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