This paper discusses the generation of production test limits from circuit analysis software utilizing Monte Carlo techniques. The general process of converting data from PSpice- and Micro-Cap III- is described. A specific example of directly converting data from PSpice Monte Carlo analysis into Audio Precision System One- test limits is shown.

Authors: Jeffs, Rick; Cook, Devin
Affiliation: Rane Corporation, Mukilteo,WA
AES Conference: 11th International Conference: Test & Measurement (May 1992)
Paper Number: 11-008
Publication Date: May 1, 1992 Import into BibTeX
Subject: Test & Measurement
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=6288

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