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Generating Production Test Limits Based on Software Derived Monte Carlo Analysis

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This paper discusses the generation of production test limits from circuit analysis software utilizing Monte Carlo techniques. The general process of converting data from PSpice- and Micro-Cap III- is described. A specific example of directly converting data from PSpice Monte Carlo analysis into Audio Precision System One- test limits is shown.

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Permalink: http://www.aes.org/e-lib/browse.cfm?elib=6288

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