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Generating Production Test Limits Based on Software Derived Monte Carlo Analysis

This paper discusses the generation of production test limits from circuit analysis software utilizing Monte Carlo techniques. The general process of converting data from PSpice- and Micro-Cap III- is described. A specific example of directly converting data from PSpice Monte Carlo analysis into Audio Precision System One- test limits is shown.

Authors: Jeffs, Rick; Cook, Devin
Affiliation: Rane Corporation, Mukilteo,WA
AES Conference:11th International Conference: Test & Measurement (May 1992)
Paper Number:11-008 Import into BibTeX
Subject:Test & Measurement

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E-Library Location: (CD aes16)   /procintl/1992po05/1416.pdf

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