Generating Production Test Limits Based on Software Derived Monte Carlo Analysis
This paper discusses the generation of production test limits from circuit analysis software utilizing Monte Carlo techniques. The general process of converting data from PSpice- and Micro-Cap III- is described. A specific example of directly converting data from PSpice Monte Carlo analysis into Audio Precision System One- test limits is shown.
Click to purchase paper as a non-member or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member and would like to subscribe to the E-Library then Join the AES!
This paper costs $33 for non-members and is temporarily free for AES members.