Modern ADCs and DACs are capable of achieving ever higher levels of performance. Confirming the achievement of the best possible performance involves the use of various test techniques. Having found some performance shortcomings, various test techniques are described which aid in the diagnosis of the cause. These include clock jitter measurement techniques, and the use of DC offset injection.

Author: Harris, Steven
Affiliation: Crystal Semiconductor Corporation, Austin,TX
AES Conference: 11th International Conference: Test & Measurement (May 1992)
Paper Number: 11-010
Publication Date: May 1, 1992 Import into BibTeX
Subject: Test & Measurement
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=6286

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