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Loudspeaker Production Testing Using the Techron TEF System 20 TDS Analyzer and Host PC

A comprehensive system for doing production testing of loudspeakers and systems is described. Multiple TEF analyzers can be controlled by a single host computer to create elaborate test environments. The software allows the test engineer to orchestrate very complex test sequences while simultaneously minimizing the perceived complexity of the system as viewed by the test operator. Tests that can be incorporated in the test sequence, with pass/fail window parameters, include any or all of the following (in any order): frequency response, phase response (polarity), harmonic tracking, harmonic distortion (of specific harmonics), THD, THD and noise, spectrum analysis (FFT), and impedance. Options include the capability to completely store all the raw data from a test run for after-the-fact review and analysis.

Authors: Schwing, Donald; Keele, Jr., D. B. (Don)
Affiliations: Techron, Div. Crown International Inc., Elkhart, IN ; DBK Associates and Consultant to Techron, Div. Crown International Inc., Elkhart, IN(See document for exact affiliation information.)
AES Conference:11th International Conference: Test & Measurement (May 1992)
Paper Number:11-032 Import into BibTeX
Subject:Test & Measurement

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