A New Technique for Fast Response Measurements Using Linear Swept Sine Excitation
Response measurements performed using Time Delay Spectrometry utilize a linearly swept sinusoidal excitation signal. Increasing the sweep rate in TDS can result in serious errors in the measured response. A new measurement technique is introduced which allows faster sweep rates to be used than with traditional TDS measurements. This technique enables the correct measurement of the complex time-selective frequency response as well as providing flexibility in the application of windowing functions.
Click to purchase paper or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member and would like to subscribe to the E-Library then Join the AES!
This paper costs $33 for non-members, $5 for AES members and is free for E-Library subscribers.