A New Technique for Fast Response Measurements Using Linear Swept Sine Excitation
Response measurements performed using Time Delay Spectrometry utilize a linearly swept sinusoidal excitation signal. Increasing the sweep rate in TDS can result in serious errors in the measured response. A new measurement technique is introduced which allows faster sweep rates to be used than with traditional TDS measurements. This technique enables the correct measurement of the complex time-selective frequency response as well as providing flexibility in the application of windowing functions.
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