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Using Cross-Domain Analysis in the Design and Test of Analog-Digital Systems

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Microprocessor based analog/digital systems present a unique set of problems during design and test. Relating symptoms in both the analog and digital domain to their hardware or software sources often becomes a challenge. Using a modular logic analysis system, cross domain analysis correlates symptoms with their sources by displaying state, timing, and analog data simultaneously with a common trigger point. This paper demonstrates cross domain analysis through explanation and example.

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Permalink: https://www.aes.org/e-lib/browse.cfm?elib=5572

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