The use of ESPI now enables the advantages of whole field component analysis to be applied in real time to inspect equipment in workshop facilities. This paper will attempt to identify some recent developments which now yield high quality quantifiable results to the engineering community. The results given will concentrate on applications concerning both the component response and the system response. ESPI combines the benefits of holographic optical data with the ability to undertake digital image processing.

Author: Tyrer, John R.
Affiliation: Department of Mechanical Engineering, Loughborough University of Technology, Loughborough, England
AES Convention: 82 (March 1987) Paper Number: 2482
Publication Date: March 1, 1987 Import into BibTeX
Subject: Measurement and Instrumentation
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=4947

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