AES E-Library

AES E-Library

Determining Manufacture Variation in Loudspeakers Through Measurement of Thiele/Small Parameters

Document Thumbnail

Thiele/Small parameters have become a standard for characterizing loudspeakers. Using fairly straightforward methods, the Thiele/Small parameters for twenty nominally identical loudspeakers were determined. The data were compiled to determine the manufacturing variations. Manufacturing tolerances can have a large impact on the variability and quality of loudspeakers produced. Generally, when more stringent tolerances are applied, there is less variation and drivers become more expensive. Now that the loudspeakers have been characterized, each one will be driven to failure. Some loudspeakers will be intentionally degraded to accelerate failures. The goal is to correlate variation in the Thiele/Small parameters with variation in speaker failure modes and operating life.

Authors:
Affiliation:
AES Convention: Paper Number:
Publication Date:
Subject:
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=14741

Click to purchase paper as a non-member or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member and would like to subscribe to the E-Library then Join the AES!

This paper costs $33 for non-members and is free for AES members and E-Library subscribers.

Learn more about the AES E-Library

E-Library Location:

Start a discussion about this paper!


AES - Audio Engineering Society