The scanning electron microscope (SEM) has only recently become generally available as a commercial device. The combination of high resolution and high magnification with a remarkable depth of focus provided by the SEM, together with simple procedures in specimen preparation, make this instrument admirably suited for use in disc-recording research and development. A description of the SEM is given, and photomicrographs of details of recording and playback styli and of new and worn groove walls in records are shown.

Authors: Woodward, J. G.; Coutts, M. D.; Levin, E. R.
Affiliation: RCA Laboratories, Princeton, NJ
AES Convention: 34 (April 1968) Paper Number: 569
Publication Date: April 1, 1968 Import into BibTeX
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=1441

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