During the loudspeaker manufacturing process, particles may become trapped inside the loudspeaker, resulting in a distinctive defect that is easily heard but difficult to measure. To give a clearer view of the problem, Time-Frequency maps are shown for some defective loudspeakers. Based on this analysis, a reliable testing procedure using a swept-sine stimulus, high-pass filter, and RMS-envelope analysis is presented. Further possible enhancements and applications of the method are listed.

Authors: Temme, Steve; Brunet, Pascal; Chakroff, Evan
Affiliations: Listen, Inc. Boston, MA ; Tufts University, Medford, MA (See document for exact affiliation information.)
AES Convention: 115 (October 2003) Paper Number: 5883
Publication Date: October 1, 2003 Import into BibTeX
Subject: Loudspeakers
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=12407

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