An improvement of loudspeaker baffle measurements is presented. The proposed method uses impedance-based measurement for low frequencies, and this response is used to correct an acoustically measured impulse response before the diffraction from the baffle edges is gated out. The low-frequency response can then be used to process the gated response, yielding an improvement in low-frequency responses over previous methods.

Author: Backman, Juha
Affiliations: Nokia Mobile Phones, Espoo, Finland ; Helsinki University of Technology, Acoustics Laboratory, Espoo, Finland(See document for exact affiliation information.)
AES Convention: 112 (April 2002) Paper Number: 5510
Publication Date: April 1, 2002 Import into BibTeX
Subject: Loudspeakers
Permalink: https://www.aes.org/e-lib/browse.cfm?elib=11378

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